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微型电容位移传感器

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微型电容位移传感器

AFP-250M-CTR/SE* AFP-500M-CTR/SE
品牌: 美国MTI 规格: AFP-250M-CTR/SE* AFP-500M-CTR/SE 备注: 扁平式电容位移传感器
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微型电容位移传感器

AccumeasureTM Capacitance Probes for AccumeasureTM D series
 
 
MTI Instruments Flat Capacitance Probes for Grounded Targets
 
MTI’s flat capacitance probe series. The thin probes may be used as is or bonded to a flat plate with mounting holes. Applications include single ended and double sided gap measurement such as commutator gaps, automotive and aviation assemblies.
 

Optionally, probes can be ordered bonded to a flat steel plate with 4X countersunk screw holes for conventional fastener attachment

 
General Specifications for Flat Probes
 
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Push Pull Flat Probes for Ungrounded Targets
 
Standard capacitive sensors require the target to be electrically grounded. Current flows from the probe face to the target and back to the amplifier to complete the circuit. The capacitance between probe and target is proportional to the distance and converted to a 0 - 10V output from the amplifier. The measurement of electrically grounded targets can be, however, affected by changes in the electrical conductivity or ground path of the target.
To eliminate the effects of these variations, MTI developed a unique version of the Accumeasure sensor called the push-pull. In this design each probe consists of two capacitance sensors, built into one probe body. Each sensor is driven at the same voltage; however, there is a 180 degree phase shift between signals. This shift allows the current path to travel across the target surface rather than through the target to ground, eliminating any inaccuracies created by poorly grounded targets.
 
  
  General Specifications for Flat Push Pull Probes
 
 
 
Optional Accessories
 
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Probe Recommended Stand-off Ranges
 
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Optional Accessories
Flat probes can be bonded back to back and inserted into a handle (8000-6443) or used stand-alone to make thin gap probes. Additionally, a shim may be bonded between the probes for added stiffness.
Contact MTI sales with your requirements for measuring roller or die slots.

 
 
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MTI has custom capability to design and manufacture a variety of probes to suit unique applications. This flat probe design capability allows for relatively inexpensive probes when produced in quantity.

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MTI’s back-to-back push-pull probes can work as gap probes on ungrounded targets. These probes require a four channel amplifier such as the Digital Accumeasure D400 to operate.

 
Unmounted Probe Bonding Instructions
The probes can also be bonded back to back on a thin SS tab for insertion into slots or gaps.
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微型电容位移传感器
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  • 扁平式电容位移传感器.pdf

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